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 Advance Product Information
August 29, 2000
Ka Band Low Noise Amplifier
TGA1319B
Key Features and Performance
* * * * * * 0.15um pHEMT Technology 21-27 GHz Frequency Range 1.75 dB Nominal Noise Figure 19 dB Nominal Gain 8dBm Pout 3V, 45 mA Self -biased Point-to-Point Radio Point-to-Multipoint Communications
5 0 -5
Chip Dimensions 2.235 mm x 1.145 mm Preliminary Data, 6-10 Fixtured samples @ 25C
two 1-mil ball bonds at RF interconnects
6.0 5.0 4.0
Primary Applications
* *
e
3.0 2.0 1.0 0.0 15.0
S11 -10 (dB)
-15 -20 -25
16.0
17.0
18.0
19.0
20.0
21.0
22.0
23.0
24.0
25.0
26.0
1
3
6
8
11
13
16
18
21
23
26
28
31
33
36
38
Frequency (GHz)
Frequency (GHz)
NF @ 25C
25
0 -5
S11 @ 25C
20
-10
-15
15
S21 (dB)
10
S22 (dB)
-20 -25
-30
5
-35
-40
0
1 3 6 8 11 13 16 18 21 23 26 28 31 33 36 38
-45 1 3 6 8 11 13 16 18 21 23 26 28 31 33 36 38
Frequency (GHz)
Fre que ncy (GHz)
Gain @ 25C
S22 @ 25C
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications subject to change without notice
TriQuint Semiconductor Texas : Phone (972)994-8465 Fax (972)994 8504 Web: www.triquint.com
1
Advance Product Information
August 29, 2000
TGA1319B
Vd=3V
100 pF
100 pF
100 pF
Gnd TGA1319B - Recommended Assembly Drawing
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications subject to change without notice
TriQuint Semiconductor Texas : Phone (972)994-8465 Fax (972)994 8504 Web: www.triquint.com
Advance Product Information
August 29, 2000
TGA1319B Assembly Process Notes
Reflow process assembly notes: *= *= *= *= *= AuSn (80/20) solder with limited exposure to temperatures at or above 300C alloy station or conveyor furnace with reducing atmosphere no fluxes should be utilized coefficient of thermal expansion matching is critical for long-term reliability storage in dry nitrogen atmosphere
Component placement and adhesive attachment assembly notes: *= *= *= *= *= *= *= vacuum pencils and/or vacuum collets preferred method of pick up avoidance of air bridges during placement force impact critical during auto placement organic attachment can be used in low-power applications curing should be done in a convection oven; proper exhaust is a safety concern microwave or radiant curing should not be used because of differential heating coefficient of thermal expansion matching is critical
Interconnect process assembly notes: *= *= *= *= *= thermosonic ball bonding is the preferred interconnect technique force, time, and ultrasonics are critical parameters aluminum wire should not be used discrete FET devices with small pad sizes should be bonded with 0.0007-inch wire maximum stage temperature: 200C
GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should be observed during handling, assembly and test.
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications are subject to change without notice.
TriQuint Semiconductor Texas : Phone (972)994-8465 Fax (972)994 8504 Web: www.triquint.com


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